ACRC Course – Reliability of Semiconductor Devices / Dr. Eitan Shauli

A 3-day course in which we will go over the failure mechanisms of electronic devices. Understanding of reliability statistics and aging acceleration methods to ensure ingredient lifetime. Failure due to electrothermal migration, migration due to stress, deterioration and failure due to hot electrons, deterioration and failure due to accumulation of charges, reliability of oxides, statistics suitable for tests, product reliability – test and analysis methodology, reliability for the automotive industry, main standards.